Statistics

Total Visits

Views
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits 867

Total Visits Per Month

May 2014 June 2014 July 2014 August 2014 September 2014 October 2014 November 2014
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits 18 12 17 14 15 21 23

File Visits

Views
Chakrabarty_duke_tech_report_2009.pdf 569
Chakrabarty_duke_tech_report_2009.pdf.txt 269
license.txt 6

Top country views

Views
United States of America 517
China 117
Japan 40
Korea 29
Canada 22
Ukraine 20
Russian Federation 18
Hong Kong 15
India 13
Germany 12

Top cities views

Views
Mountain View 108
Beijing 61
Redwood City 48
Santa Clara 41
Los Angeles 31
Seoul 28
Woodbridge 23
Seattle 19
Sunnyvale 17
Kwai Chung 15