Statistics

Total Visits

Views
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits 967

Total Visits Per Month

February 2015 March 2015 April 2015 May 2015 June 2015 July 2015 August 2015
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits 13 19 0 13 8 12 0

File Visits

Views
Chakrabarty_duke_tech_report_2009.pdf 636
Chakrabarty_duke_tech_report_2009.pdf.txt 291
license.txt 6

Top country views

Views
United States of America 588
China 121
Japan 40
Korea 30
Canada 22
Ukraine 20
Russian Federation 18
Germany 16
Hong Kong 15
France 14

Top cities views

Views
Mountain View 108
Beijing 62
Redwood City 48
Santa Clara 44
Woodbridge 34
Los Angeles 31
Seoul 29
Sunnyvale 29
Seattle 20
Kwai Chung 15