| Views | |
| Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits | 695 |
| December 2012 | January 2013 | February 2013 | March 2013 | April 2013 | May 2013 | June 2013 | |
| Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits | 21 | 33 | 23 | 18 | 25 | 26 | 8 |
| Views | |
| dt_tech_report_2010__v002.pdf | 303 |
| license.txt | 19 |
| dt_tech_report_2010__v002.pdf.txt | 1 |
| Views | |
| United States of America | 397 |
| China | 117 |
| Russian Federation | 30 |
| Japan | 29 |
| Hong Kong | 28 |
| Ukraine | 25 |
| Korea | 13 |
| Germany | 9 |
| Netherlands | 9 |
| France | 6 |
| Views | |
| Beijing | 77 |
| Mountain View | 49 |
| Redwood City | 44 |
| Los Angeles | 30 |
| Kwai Chung | 28 |
| Redmond | 15 |
| Moscow | 14 |
| Seattle | 13 |
| Seoul | 12 |
| Durham | 11 |