Show simple item record

dc.contributor.author Kavousianos, X
dc.contributor.author Chakrabarty, K
dc.date.accessioned 2010-10-26T18:49:27Z
dc.date.issued 2011-05
dc.identifier http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000289843900012&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=47d3190e77e5a3a53558812f597b0b92
dc.identifier.citation IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2011, 30 (5), pp. 787 - 791
dc.identifier.issn 0278-0070
dc.identifier.uri http://hdl.handle.net/10161/2846
dc.format.extent 787 - 791
dc.language.iso en_US en_US
dc.relation.ispartof IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
dc.relation.ispartofseries ECE-2010-02
dc.relation.isversionof 10.1109/TCAD.2010.2101750
dc.subject Defect-oriented testing
dc.subject multi-detect testing
dc.title Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects
dc.type Journal Article
dc.department Engineering
pubs.author-url http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000289843900012&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=47d3190e77e5a3a53558812f597b0b92
pubs.issue 5
pubs.organisational-group /Duke
pubs.organisational-group /Duke/Pratt School of Engineering
pubs.organisational-group /Duke/Pratt School of Engineering/Electrical and Computer Engineering
pubs.organisational-group /Duke/Trinity College of Arts & Sciences
pubs.organisational-group /Duke/Trinity College of Arts & Sciences/Computer Science
pubs.publication-status Published
pubs.volume 30

Files in this item

This item appears in the following Collection(s)

Show simple item record