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On the possibility of a shunt-stabilized superlattice terahertz emitter

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dc.contributor.author Xu, Huidong en_US
dc.contributor.author Teitsworth, Stephen en_US
dc.date.accessioned 2011-04-15T16:46:41Z
dc.date.available 2011-04-15T16:46:41Z
dc.date.issued 2010 en_US
dc.identifier.citation Xu,Huidong;Teitsworth,Stephen W.. 2010. On the possibility of a shunt-stabilized superlattice terahertz emitter. Applied Physics Letters 96(2): 22101-22101. en_US
dc.identifier.issn 0003-6951 en_US
dc.identifier.uri http://hdl.handle.net/10161/3244
dc.description.abstract High field electronic transport through a strongly coupled superlattice (SL) with a shunting side layer is numerically studied using a drift-diffusion model that includes both vertical and lateral dynamics. The bias voltage corresponds to an average electric field in the negative differential conductivity region of the intrinsic current-field curve of the SL, a condition that generally implies space charge instability. Key structural parameters associated with both the shunt layer and SL are identified for which the shunt layer stabilizes a uniform electric field profile. These results support the possibility to realize a SL-based terahertz oscillator with a carefully designed structure. en_US
dc.language.iso en_US en_US
dc.publisher AMER INST PHYSICS en_US
dc.relation.isversionof doi:10.1063/1.3291614 en_US
dc.subject diffusion en_US
dc.subject electrical conductivity en_US
dc.subject electron spin polarisation en_US
dc.subject superlattices en_US
dc.subject semiconductor superlattices en_US
dc.subject electron-transport en_US
dc.subject conductivity en_US
dc.subject device en_US
dc.subject system en_US
dc.subject model en_US
dc.subject physics, applied en_US
dc.title On the possibility of a shunt-stabilized superlattice terahertz emitter en_US
dc.type Article en_US
dc.description.version Version of Record en_US
duke.date.pubdate 2010-1-11 en_US
duke.description.endpage 22101 en_US
duke.description.issue 2 en_US
duke.description.startpage 22101 en_US
duke.description.volume 96 en_US
dc.relation.journal Applied Physics Letters en_US

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