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Inkless Microcontact Printing on SAMs of Boc- and TBS-Protected Thiols

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dc.contributor.author Shestopalov, Alexander A. en_US
dc.contributor.author Toone, Eric John en_US
dc.date.accessioned 2011-06-21T17:27:01Z
dc.date.available 2011-06-21T17:27:01Z
dc.date.issued 2010 en_US
dc.identifier.citation Shestopalov,Alexander A.;Clark,Robert L.;Toone,Eric J.. 2010. Inkless Microcontact Printing on SAMs of Boc- and TBS-Protected Thiols. Nano Letters 10(1): 43-46. en_US
dc.identifier.issn 1530-6984 en_US
dc.identifier.uri http://hdl.handle.net/10161/4097
dc.description.abstract We report a new inkless catalytic mu CP technique that achieves accurate, Fast, and complete pattern reproduction on SAMS of Boc- and TBS-protected thiols immobilized on gold using a polyurethane-acrylate stamp functionalized with covalently bound, sulfonic acids. Pattern transfer is complete at room temperature just after one minute of contact and renders sub-200 nm size structures of chemically differentiated SAMS. en_US
dc.language.iso en_US en_US
dc.publisher AMER CHEMICAL SOC en_US
dc.relation.isversionof doi:10.1021/nl902588d en_US
dc.subject microcontact printing en_US
dc.subject soft lithography en_US
dc.subject catalytic lithography en_US
dc.subject self-assembled monolayers en_US
dc.subject scanning-electron-microscopy en_US
dc.subject lithography en_US
dc.subject soft en_US
dc.subject gold en_US
dc.subject nanofabrication en_US
dc.subject alkanethiols en_US
dc.subject patterns en_US
dc.subject fabrication en_US
dc.subject dimensions en_US
dc.subject chemistry, multidisciplinary en_US
dc.subject nanoscience & nanotechnology en_US
dc.subject materials science, multidisciplinary en_US
dc.title Inkless Microcontact Printing on SAMs of Boc- and TBS-Protected Thiols en_US
dc.title.alternative en_US
dc.description.version Version of Record en_US
duke.date.pubdate 2010-1-0 en_US
duke.description.endpage 46 en_US
duke.description.issue 1 en_US
duke.description.startpage 43 en_US
duke.description.volume 10 en_US
dc.relation.journal Nano Letters en_US

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