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Measurements of nonlinear refractive index in scattering media

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dc.contributor.author Samineni, Prathyush en_US
dc.contributor.author Perret, Zachary en_US
dc.contributor.author Warren en_US
dc.contributor.author Fischer, Martin en_US
dc.date.accessioned 2011-06-21T17:27:44Z
dc.date.available 2011-06-21T17:27:44Z
dc.date.issued 2010 en_US
dc.identifier.citation Samineni,Prathyush;Perret,Zachary;Warren,Warren S.;Fischer,Martin C.. 2010. Measurements of nonlinear refractive index in scattering media. Optics Express 18(12): 12727-12735. en_US
dc.identifier.issn 1094-4087 en_US
dc.identifier.uri http://hdl.handle.net/10161/4246
dc.description.abstract We have recently developed a spectral re-shaping technique to simultaneously measure nonlinear refractive index and nonlinear absorption. In this technique, the information about the nonlinearities is encoded in the frequency domain, rather than in the spatial domain as in the conventional Z-scan method. Here we show that frequency encoding is much more robust with respect to scattering. We compare spectral re-shaping and Z-scan measurements in a highly scattering environment and show that reliable spectral re-shaping measurements can be performed even in a regime that precludes standard Z-scans. (C) 2010 Optical Society of America en_US
dc.language.iso en_US en_US
dc.publisher OPTICAL SOC AMER en_US
dc.relation.isversionof en_US
dc.subject self-phase modulation en_US
dc.subject z-scan measurement en_US
dc.subject single-beam en_US
dc.subject 2-photon en_US
dc.subject absorption en_US
dc.subject optical nonlinearities en_US
dc.subject microscopy en_US
dc.subject solids en_US
dc.subject pulses en_US
dc.subject optics en_US
dc.title Measurements of nonlinear refractive index in scattering media en_US
dc.title.alternative en_US
dc.description.version Version of Record en_US
duke.date.pubdate 2010-6-7 en_US
duke.description.endpage 12735 en_US
duke.description.issue 12 en_US
duke.description.startpage 12727 en_US
duke.description.volume 18 en_US
dc.relation.journal Optics Express en_US

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