Browsing Technical Reports and Working Papers by Subject

Now showing items 1-20 of 26

Subject
3D integration, cost modeling, heuristic optimization
anomaly detection
automatic-test-pattern-generation
defect
defect-oriented testing
delay test
Digital microfluidics, faults, reliability, cyberhysical integration, hardware/software co-design
Digital print, workflow optimization, evolutionary algorithms, genetic algorithms, scheduling and resource allocation
Dynamic voltage scaling
Filtering
functional test
individual sequences
Multi-core SOCs
Multi-detect testing
output deviation
output deviations
process variations
register-transfer level
RT-level
small-delay defects