Browsing Technical Reports by Author "Kavousianos, Xrysovalantis"

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Generation of Compact Single-Detect Stuck-At Test Sets Targeting Unmodeled Defects

Kavousianos, Xrysovalantis; Chakrabarty, Krishnendu (2010-10-26)

We present a new method to generate compact stuck-at test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large N-detect pattern repository, by using a new ...
Time-Division Multiplexing for Testing SoCs with DVS and Multiple Voltage Islands

Kavousianos, Xrysovalantis; Chakrabarty, Krishnendu; Arvind Jain, Rubin Parekhji (2012-03-28)

Dynamic voltage scaling (DVS) has been widely adopted in multicore SoCs for reducing dynamic power consumption. Despite its benefits, the use of DVS increases test time because high product quality can only be ensured ...