On-demand digital-print service offers mass customization
and exemplifies personalized manufacturing services.
We describe a real-time and online optimization technique
based on genetic algorithms (GA) for print factory ...
Dynamic voltage scaling (DVS) has been widely
adopted in multicore SoCs for reducing dynamic power consumption.
Despite its benefits, the use of DVS increases test time
because high product quality can only be ensured ...
Functional test sequences are often used in manufacturing
testing to target defects that are not detected by structural
test. Therefore, it is necessary to evaluate the quality of functional
test sequences. However, it ...
We present a new method to generate compact stuck-at
test sets that offer high defect coverage. The proposed method
first selects the most effective patterns from a large N-detect pattern
repository, by using a new ...
Timing-related defects are a major cause for test escapes and field returns for very-deep-sub-micron (VDSM) integrated circuits (ICs). Small-delay variations induced by crosstalk, process variations, power-supply noise, ...