Browsing Technical Reports by Subject

Now showing items 4-23 of 26

Subject
defect
defect-oriented testing
delay test
Digital microfluidics, faults, reliability, cyberhysical integration, hardware/software co-design
Digital print, workflow optimization, evolutionary algorithms, genetic algorithms, scheduling and resource allocation
Dynamic voltage scaling
Filtering
functional test
individual sequences
Multi-core SOCs
Multi-detect testing
output deviation
output deviations
process variations
register-transfer level
RT-level
small-delay defects
SOC testing
test grading
test-pattern grading