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Browsing Technical Reports by Submit Date

Now showing items 1-11 of 11

Test-Cost Optimization and Test-Flow Selection for 3D-Stacked ICs

Agrawal, Mukesh; Chakrabarty, Krishnendu; Eklow, Bill (2012-10-26)

Three-dimensional (3D) integration is an attractive technology platform for next-generation ICs. Despite the benefits offered by 3D integration, test cost remains a major concern, and analysis and tools are needed to ...
Error Recovery in Cyberphysical Digital-Microfluidic Biochips

Luo, Yan; Chakrabarty, Krishnendu; Ho, Tsung-Yi (2012-07-20)

Droplet-based “digital” microfluidics technology has now come of age and software-controlled biochips for healthcare applications are starting to emerge. However, today’s digital microfluidic biochips suffer from the ...
Real-Time and Online Digital-Print Factory Workflow Optimization

Duan, Qing; Agrawal, Mukesh; Chakrabarty, Krishnendu; Zeng, Jun; Dispoto, Gary (2012-03-30)

On-demand digital-print service offers mass customization and exemplifies personalized manufacturing services. We describe a real-time and online optimization technique based on genetic algorithms (GA) for print factory ...
Time-Division Multiplexing for Testing SoCs with DVS and Multiple Voltage Islands

Kavousianos, Xrysovalantis; Chakrabarty, Krishnendu; Arvind Jain, Rubin Parekhji (2012-03-28)

Dynamic voltage scaling (DVS) has been widely adopted in multicore SoCs for reducing dynamic power consumption. Despite its benefits, the use of DVS increases test time because high product quality can only be ensured ...
Functional Test-Sequence Grading at Register-Transfer Level

Fang, Hongxia; Chakrabarty, Krishnendu; Jas, Abhijit; Tirumurti, Chandra (2011-07-12)

Functional test sequences are often used in manufacturing testing to target defects that are not detected by structural test. Therefore, it is necessary to evaluate the quality of functional test sequences. However, it ...
Generation of Compact Single-Detect Stuck-At Test Sets Targeting Unmodeled Defects

Kavousianos, Xrysovalantis; Chakrabarty, Krishnendu (2010-10-26)

We present a new method to generate compact stuck-at test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large N-detect pattern repository, by using a new ...
Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits

Yilmaz, Mahmut; Chakrabarty, Krishnendu; Tehranipoor, Mohammad (2010-03-29)

Timing-related defects are a major cause for test escapes and field returns for very-deep-sub-micron (VDSM) integrated circuits (ICs). Small-delay variations induced by crosstalk, process variations, power-supply noise, ...
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicron Integrated Circuits

Yilmaz, Mahmut; Chakrabarty, Krishnendu; Tehranipoor, Mohammad (2009-09-14)

Timing-related defects are major contributors to test escapes and in-field reliability problems for very-deep submicron integrated circuits. Small delay variations induced by crosstalk, process variations, power-supply ...
Sequential anomaly detection in the presence of noise and limited feedback

Raginsky, Maxim; Willett, Rebecca (2009-08-13)

Recent work has established the efficacy of using online convex programming methods on exponential families in the context of sequential probability assignment. This paper describes methods which build upon that framework ...
Developing a Flexible SPEAR3-Based Psychophysical Research Platform for Testing Cochlear Implant Users

Stohl, Joshua S.; Throckmorton, Chandra S.; Collins, Leslie M. (2008-05-08)

An experimental psychophysical interface has been developed using Hearworks Pty Ltd’s SPEAR3 research sound processor, which is compatible with Cochlear Corporation’s Nucleus CI22 and CI24 implants. Modifications to the ...
Hypergraph-Based Anomaly Detection in Very Large Networks

Silva, Jorge; Willett, Rebecca (2008-02)

This paper addresses the problem of detecting anomalous interactions or traffic within a very large network using a limited number of unlabeled observations. In particular, consider n recorded interactions among p nodes, ...