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Browsing Technical Reports by Duke Department "Engineering"

Now showing items 1-7 of 7

Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits

Yilmaz, Mahmut; Chakrabarty, Krishnendu; Tehranipoor, Mohammad (2010-03-29)

Timing-related defects are a major cause for test escapes and field returns for very-deep-sub-micron (VDSM) integrated circuits (ICs). Small-delay variations induced by crosstalk, process variations, power-supply noise, ...
Developing a Flexible SPEAR3-Based Psychophysical Research Platform for Testing Cochlear Implant Users

Stohl, Joshua S.; Throckmorton, Chandra S.; Collins, Leslie M. (2008-05-08)

An experimental psychophysical interface has been developed using Hearworks Pty Ltd’s SPEAR3 research sound processor, which is compatible with Cochlear Corporation’s Nucleus CI22 and CI24 implants. Modifications to the ...
Functional Test-Sequence Grading at Register-Transfer Level

Fang, Hongxia; Chakrabarty, Krishnendu; Jas, Abhijit; Tirumurti, Chandra (2011-07-12)

Functional test sequences are often used in manufacturing testing to target defects that are not detected by structural test. Therefore, it is necessary to evaluate the quality of functional test sequences. However, it ...
Generation of Compact Single-Detect Stuck-At Test Sets Targeting Unmodeled Defects

Kavousianos, Xrysovalantis; Chakrabarty, Krishnendu (2010-10-26)

We present a new method to generate compact stuck-at test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large N-detect pattern repository, by using a new ...
Hypergraph-Based Anomaly Detection in Very Large Networks

Silva, Jorge; Willett, Rebecca (2008-02)

This paper addresses the problem of detecting anomalous interactions or traffic within a very large network using a limited number of unlabeled observations. In particular, consider n recorded interactions among p nodes, ...
Sequential anomaly detection in the presence of noise and limited feedback

Raginsky, Maxim; Willett, Rebecca (2009-08-13)

Recent work has established the efficacy of using online convex programming methods on exponential families in the context of sequential probability assignment. This paper describes methods which build upon that framework ...
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicron Integrated Circuits

Yilmaz, Mahmut; Chakrabarty, Krishnendu; Tehranipoor, Mohammad (2009-09-14)

Timing-related defects are major contributors to test escapes and in-field reliability problems for very-deep submicron integrated circuits. Small delay variations induced by crosstalk, process variations, power-supply ...