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dc.contributor.author Kavousianos, X
dc.contributor.author Chakrabarty, K
dc.contributor.author Jain, A
dc.contributor.author Parekhji, R
dc.contributor.author IEEE
dc.date.accessioned 2012-03-28T16:43:35Z
dc.date.issued 2012
dc.identifier http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000309227500020&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=47d3190e77e5a3a53558812f597b0b92
dc.identifier.citation 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2012
dc.identifier.issn 1530-1877
dc.identifier.uri http://hdl.handle.net/10161/5120
dc.relation.ispartof 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
dc.relation.ispartofseries ECE;2012-01
dc.title Time-Division Multiplexing for Testing SoCs with DVS and Multiple Voltage Islands
dc.type Journal Article
pubs.author-url http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000309227500020&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=47d3190e77e5a3a53558812f597b0b92
pubs.organisational-group /Duke
pubs.organisational-group /Duke/Pratt School of Engineering
pubs.organisational-group /Duke/Pratt School of Engineering/Electrical and Computer Engineering
pubs.organisational-group /Duke/Trinity College of Arts & Sciences
pubs.organisational-group /Duke/Trinity College of Arts & Sciences/Computer Science
pubs.publication-status Published

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