Show simple item record Kavousianos, X Chakrabarty, K Jain, A Parekhji, R IEEE 2012-03-28T16:43:35Z 2012
dc.identifier.citation 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2012
dc.identifier.issn 1530-1877
dc.relation.ispartof 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
dc.relation.ispartofseries ECE;2012-01
dc.title Time-Division Multiplexing for Testing SoCs with DVS and Multiple Voltage Islands
dc.type Journal Article
pubs.organisational-group /Duke
pubs.organisational-group /Duke/Pratt School of Engineering
pubs.organisational-group /Duke/Pratt School of Engineering/Electrical and Computer Engineering
pubs.organisational-group /Duke/Trinity College of Arts & Sciences
pubs.organisational-group /Duke/Trinity College of Arts & Sciences/Computer Science
pubs.publication-status Published

Files in this item

This item appears in the following Collection(s)

Show simple item record