| Views | |
| Wafer-Level Testing and Test Planning for Integrated Circuits | 594 |
| November 2012 | December 2012 | January 2013 | February 2013 | March 2013 | April 2013 | May 2013 | |
| Wafer-Level Testing and Test Planning for Integrated Circuits | 26 | 25 | 40 | 22 | 32 | 40 | 44 |
| Views | |
| D_Bahukudumbi_Sudarshan_a_200808.pdf | 1245 |
| D_Bahukudumbi_Sudarshan_a_200808.pdf.txt | 2 |
| Views | |
| United States of America | 335 |
| China | 87 |
| India | 23 |
| Japan | 21 |
| Russian Federation | 19 |
| Taiwan | 18 |
| Ukraine | 14 |
| Germany | 10 |
| Malaysia | 9 |
| Singapore | 7 |
| Views | |
| Mountain View | 63 |
| Beijing | 62 |
| Redwood City | 43 |
| Moscow | 10 |
| Redmond | 10 |
| Needham Heights | 8 |
| San Francisco | 8 |
| San Jose | 8 |
| Portland | 7 |
| Taipei | 7 |