Robles, Francisco EWax, Adam2011-06-212010-02-01https://hdl.handle.net/10161/4226We present measurements of morphological features in a thick turbid sample using light-scattering spectroscopy (LSS) and Fourier-domain low-coherence interferometry (fLCI) by processing with the dual-window (DW) method. A parallel frequency domain optical coherence tomography (OCT) system with a white-light source is used to image a two-layer phantom containing polystyrene beads of diameters 4.00 and 6.98 mum on the top and bottom layers, respectively. The DW method decomposes each OCT A-scan into a time-frequency distribution with simultaneously high spectral and spatial resolution. The spectral information from localized regions in the sample is used to determine scatterer structure. The results show that the two scatterer populations can be differentiated using LSS and fLCI.en-USAluminum OxideEthylene GlycolFourier AnalysisInterferometryLightModels, StatisticalNanoparticlesNanotechnologyScattering, RadiationSpectrophotometrySurface Plasmon ResonanceWater