Wang, Kevin2013-04-162013-04-162013-04-16https://hdl.handle.net/10161/6522Measuring the returns to R&D has been an endeavor pursued by economists with vast interest in an effort to learn more about the characteristics of successful R&D. This paper empirically measures the market valuation of firms using patent statistics as a proxy for the success of R&D. It finds that self-citation and generality patent measures are largely insignificant likely due to a tendency for newer patents to be measured incorrectly. It also attempts a measure of companies’ reputation for innovation for valuation and proposes a new method of quantification. Lastly, it finds that the market valuation of R&D investment is potentially myopic during years of stock market downturns.en-USInnovationMarket ValueTobin's QPatent GeneralityReturns to R&DSelf-citationsMarket Valuation of Patent CharacteristicsHonors thesis