Browsing by Subject "FLOW"

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    Analyzing X-ray tomographies of granular packings.
    (The Review of scientific instruments, 2017-05) Weis, Simon; Schröter, Matthias
    Starting from three-dimensional volume data of a granular packing, as, e.g., obtained by X-ray Computed Tomography, we discuss methods to first detect the individual particles in the sample and then analyze their properties. This analysis includes the pair correlation function, the volume and shape of the Voronoi cells, and the number and type of contacts formed between individual particles. We mainly focus on packings of monodisperse spheres, but we will also comment on other monoschematic particles such as ellipsoids and tetrahedra. This paper is accompanied by a package of free software containing all programs (including source code) and an example three-dimensional dataset which allows the reader to reproduce and modify all examples given.
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    Correction of beam hardening in X-ray radiograms.
    (The Review of scientific instruments, 2019-02) Baur, Manuel; Uhlmann, Norman; Pöschel, Thorsten; Schröter, Matthias
    The intensity of a monochromatic X-ray beam decreases exponentially with the distance it has traveled inside a material; this behavior is commonly referred to as Beer-Lambert's law. Knowledge of the material-specific attenuation coefficient μ allows us to determine the thickness of a sample from the intensity decrease the beam has experienced. However, classical X-ray tubes emit a polychromatic bremsstrahlung-spectrum. And the attenuation coefficients of all materials depend on the photon energy: photons with high energy are attenuated less than photons with low energy. In consequence, the X-ray spectrum changes while traveling through the medium; due to the relative increase in high energy photons, this effect is called beam hardening. For this varying spectrum, the Beer-Lambert law only remains valid if μ is replaced by an effective attenuation coefficient μeff which depends not only on the material but also on its thickness x and the details of the X-ray setup used. We present here a way to deduce μeff(x) from a small number of auxiliary measurements using a phenomenological model. This model can then be used to determine an unknown material thickness or in the case of a granular media its volume fraction.