Browsing by Author "Fang, Hongxia"
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DESIGN-FOR-TESTABILITY AND DIAGNOSIS METHODS TO TARGET UNMODELED DEFECTS IN INTEGRATED CIRCUITS AND MULTI-CHIP BOARDS
(2011)Very deep sub-micron process technologies are leading to increasing defect rates for integrated circuits (ICs) and multi-chip boards. To ensure the quality of test patterns and more effective defect screening, functional ...
