Now showing items 1-2 of 2

    • Generation of compact stuck-at test sets targeting unmodeled defects 

      Kavousianos, X; Chakrabarty, K (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2011-05-01)
      This letter presents a new method to generate compact stuck-at test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large $N$-detect repository, by using a new output ...
    • Time-division multiplexing for testing SoCs with DVS and multiple voltage islands 

      Kavousianos, X; Chakrabarty, K; Jain, A; Parekhji, R (Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012, 2012-08-13)
      Dynamic voltage scaling (DVS) has been widely adopted in multicore SoCs for reducing dynamic power consumption. Despite its benefits, the use of DVS increases test time because high product quality can only be ensured by ...