On-chip electron-impact ion source using carbon nanotube field emitters
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A lateral on-chip electron-impact ion source utilizing a carbon nanotube field emission electron source was fabricated and characterized. The device consists of a cathode with aligned carbon nanotubes, a control grid, and an ion collector electrode. The electron-impact ionization of He, Ar, and Xe was studied as a function of field emission current and pressure. The ion current was linear with respect to gas pressure from 10-4 to 10-1 Torr. The device can operate as a vacuum ion gauge with a sensitivity of approximately 1 Torr-1. Ion currents in excess of 1 μA were generated. © 2007 American Institute of Physics.
Published Version (Please cite this version)10.1063/1.2715457
Publication InfoBower, CA; Gilchrist, KH; Piascik, JR; Stoner, BR; Natarajan, S; Parker, CB; ... Glass, JT (2007). On-chip electron-impact ion source using carbon nanotube field emitters. Applied Physics Letters, 90(12). 10.1063/1.2715457. Retrieved from http://hdl.handle.net/10161/10604.
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