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Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses

dc.contributor.author Mount, E
dc.contributor.author Kabytayev, C
dc.contributor.author Crain, S
dc.contributor.author Harper, R
dc.contributor.author Baek, SY
dc.contributor.author Vrijsen, G
dc.contributor.author Flammia, ST
dc.contributor.author Brown, KR
dc.contributor.author Maunz, P
dc.contributor.author Kim, J
dc.date.accessioned 2016-01-12T05:45:05Z
dc.date.issued 2015-12-16
dc.identifier.issn 1050-2947
dc.identifier.uri https://hdl.handle.net/10161/11507
dc.description.abstract © 2015 American Physical Society.The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high-fidelity single-qubit gates for the hyperfine qubit of a Yb+171 ion trapped in a microfabricated surface-electrode ion trap. Gate error is characterized using a randomized benchmarking protocol and an average error per randomized Clifford group gate of 3.6(3)×10-4 is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.
dc.relation.ispartof Physical Review A - Atomic, Molecular, and Optical Physics
dc.relation.isversionof 10.1103/PhysRevA.92.060301
dc.title Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses
dc.type Journal article
pubs.issue 6
pubs.organisational-group Computer Science
pubs.organisational-group Duke
pubs.organisational-group Electrical and Computer Engineering
pubs.organisational-group Physics
pubs.organisational-group Pratt School of Engineering
pubs.organisational-group Trinity College of Arts & Sciences
pubs.publication-status Published
pubs.volume 92
dc.identifier.eissn 1094-1622


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