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Generation of compact stuck-at test sets targeting unmodeled defects

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Date
2011-05-01
Authors
Kavousianos, X
Chakrabarty, K
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Abstract
This letter presents a new method to generate compact stuck-at test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large $N$-detect repository, by using a new output deviation-based metric. Then it embeds complete coverage of stuck-at faults within these patterns, and uses the proposed metric to further improve their defect coverage. Results show that the proposed method outperforms a recently proposed competing approach in terms of unmodeled defect coverage. In many cases, higher defect coverage is obtained even than much larger $N$-detect test sets for several values of $N$. Finally, results provide the insight that, instead of using $N$- detect testing with as large $N$ as possible, it is more efficient to combine the output deviations metric with multi-detect testing to get high-quality, compact test sets. © 2006 IEEE.
Type
Journal article
Permalink
https://hdl.handle.net/10161/2846
Published Version (Please cite this version)
10.1109/TCAD.2010.2101750
Publication Info
Kavousianos, X; & Chakrabarty, K (2011). Generation of compact stuck-at test sets targeting unmodeled defects. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 30(5). pp. 787-791. 10.1109/TCAD.2010.2101750. Retrieved from https://hdl.handle.net/10161/2846.
This is constructed from limited available data and may be imprecise. To cite this article, please review & use the official citation provided by the journal.
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Scholars@Duke

Chakrabarty

Krishnendu Chakrabarty

John Cocke Distinguished Professor of Electrical and Computer Engineering
Krishnendu Chakrabarty is the John Cocke Distinguished Professor of Electrical and Computer Engineering and Professor of Computer Science at Duke University.
This author no longer has a Scholars@Duke profile, so the information shown here reflects their Duke status at the time this item was deposited.

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