Abstract
This letter presents a new method to generate compact stuck-at test sets that offer
high defect coverage. The proposed method first selects the most effective patterns
from a large $N$-detect repository, by using a new output deviation-based metric.
Then it embeds complete coverage of stuck-at faults within these patterns, and uses
the proposed metric to further improve their defect coverage. Results show that the
proposed method outperforms a recently proposed competing approach in terms of unmodeled
defect coverage. In many cases, higher defect coverage is obtained even than much
larger $N$-detect test sets for several values of $N$. Finally, results provide the
insight that, instead of using $N$- detect testing with as large $N$ as possible,
it is more efficient to combine the output deviations metric with multi-detect testing
to get high-quality, compact test sets. © 2006 IEEE.
Published Version (Please cite this version)
10.1109/TCAD.2010.2101750
Publication Info
Kavousianos, X; & Chakrabarty, K (2011). Generation of compact stuck-at test sets targeting unmodeled defects.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
30(5). pp. 787-791.
10.1109/TCAD.2010.2101750.
Retrieved from https://hdl.handle.net/10161/2846.
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