Show simple item record Kavousianos, X Chakrabarty, K 2010-10-26T18:49:27Z 2011-05-01
dc.identifier.citation IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2011, 30 (5), pp. 787 - 791
dc.identifier.issn 0278-0070
dc.description.abstract This letter presents a new method to generate compact stuck-at test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large $N$-detect repository, by using a new output deviation-based metric. Then it embeds complete coverage of stuck-at faults within these patterns, and uses the proposed metric to further improve their defect coverage. Results show that the proposed method outperforms a recently proposed competing approach in terms of unmodeled defect coverage. In many cases, higher defect coverage is obtained even than much larger $N$-detect test sets for several values of $N$. Finally, results provide the insight that, instead of using $N$- detect testing with as large $N$ as possible, it is more efficient to combine the output deviations metric with multi-detect testing to get high-quality, compact test sets. © 2006 IEEE.
dc.format.extent 787 - 791
dc.language.iso en_US en_US
dc.relation.ispartof IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
dc.relation.ispartofseries ECE-2010-02
dc.relation.isversionof 10.1109/TCAD.2010.2101750
dc.title Generation of compact stuck-at test sets targeting unmodeled defects
dc.type Journal Article
dc.department Engineering
pubs.issue 5
pubs.organisational-group /Duke
pubs.organisational-group /Duke/Pratt School of Engineering
pubs.organisational-group /Duke/Pratt School of Engineering/Electrical and Computer Engineering
pubs.publication-status Published
pubs.volume 30

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