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    • Functional test-sequence grading at register-transfer level 

      Fang, H; Chakrabarty, K; Jas, A; Patil, S; Tirumurti, C (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2012-01-01)
      We propose output deviations as a surrogate metric to grade functional test sequences at the register-transfer level without explicit fault simulation. Experimental results for the open-source Biquad filter core and the ...