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    • Time-division multiplexing for testing SoCs with DVS and multiple voltage islands 

      Chakrabarty, Krishnendu; Jain, A; Kavousianos, X; Parekhji, R (Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012, 2012-08-13)
      Dynamic voltage scaling (DVS) has been widely adopted in multicore SoCs for reducing dynamic power consumption. Despite its benefits, the use of DVS increases test time because high product quality can only be ensured by ...