Now showing items 1-10 of 32
Jacques Androuet du Cerceau: New outlines of a work
Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits
Timing-related defects are a major cause for test escapes and field returns for very-deep-sub-micron (VDSM) integrated circuits (ICs). Small-delay variations induced by crosstalk, process variations, power-supply noise, ...
Test-pattern selection for screening small-delay defects in very-deep submicrometer integrated circuits
(IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2010-05-01)
Timing-related defects are major contributors to test escapes and in-field reliability problems for very-deep submicrometer integrated circuits. Small delay variations induced by crosstalk, process variations, power-supply ...
Crackpots on Parade: The Nether Side of Genius & Transgressive Deconstructions
For four years, as editor of The Faculty Forum, a campus wide monthly publication at Duke University, I filled empty space in my pages with the following items of scholarly research. To liven the tone, I invented a coeditor ...
Time for intelligence interrogations
(Raleigh News and Observer, 2010-05-23)
Is Sports in Your Mission Statement?
The Professor and the Worker: Using Brazil to Better Understand Latin America's Plural Left
(Rethinking Intellectuals in Latin America, 2010)
"Black folk here and there": Repositioning other(ed) African diaspora(s) in/and "Europexs"
(The African Diaspora and the Disciplines, 2010-12-01)
The story I will begin to recount is one that seeks to expand the way we think about African diaspora(s) in/and "Europe." Using broad brushstrokes, I will explore two compound problematics that stand in as distillations ...