Show simple item record Leong, HS Guo, J Lindquist, RG Liu, QH 2011-04-15T16:46:40Z 2009-12-01
dc.identifier.citation Journal of Applied Physics, 2009, 106 (12)
dc.identifier.issn 0021-8979
dc.description.abstract We systematically investigated the surface plasmon resonance in one-dimensional (1D) subwavelength nanostructured metal films under the Kretschmann configuration. We calculated the reflectance, transmittance, and absorption for varying the dielectric fill factor, the period of the 1D nanostructure, and the metal film thickness. We have found that the small dielectric slits in the metal films reduce the surface plasmon resonance angle and move it toward the critical angle for total internal reflection. The reduction in surface plasmon resonance angle in nanostructured metal films is due to the increased intrinsic free electron oscillation frequency in metal nanostructures. Also we have found that the increasing the spatial frequency of the 1D nanograting reduces the surface plasmon resonance angle, which indicates that less momentum is needed to match the momentum of the surface plasmon-polariton. The variation in the nanostructured metal film thickness changes the resonance angle slightly, but mainly remains as a mean to adjust the coupling between the incident optical wave and the surface plasmon-polariton wave. © 2009 American Institute of Physics.
dc.language.iso en_US en_US
dc.relation.ispartof Journal of Applied Physics
dc.relation.isversionof 10.1063/1.3273359
dc.title Surface plasmon resonance in nanostructured metal films under the Kretschmann configuration
dc.type Journal Article
dc.description.version Version of Record en_US 2009-12-15 en_US
duke.description.endpage 124314 en_US
duke.description.issue 12 en_US
duke.description.startpage 124314 en_US
duke.description.volume 106 en_US
dc.relation.journal Journal of Applied Physics en_US
pubs.issue 12
pubs.organisational-group /Duke
pubs.organisational-group /Duke/Pratt School of Engineering
pubs.organisational-group /Duke/Pratt School of Engineering/Electrical and Computer Engineering
pubs.publication-status Published
pubs.volume 106

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