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Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry.
Abstract
We present measurements of morphological features in a thick turbid sample using light-scattering
spectroscopy (LSS) and Fourier-domain low-coherence interferometry (fLCI) by processing
with the dual-window (DW) method. A parallel frequency domain optical coherence tomography
(OCT) system with a white-light source is used to image a two-layer phantom containing
polystyrene beads of diameters 4.00 and 6.98 mum on the top and bottom layers, respectively.
The DW method decomposes each OCT A-scan into a time-frequency distribution with simultaneously
high spectral and spatial resolution. The spectral information from localized regions
in the sample is used to determine scatterer structure. The results show that the
two scatterer populations can be differentiated using LSS and fLCI.
Type
Journal articleSubject
Aluminum OxideEthylene Glycol
Fourier Analysis
Interferometry
Light
Models, Statistical
Nanoparticles
Nanotechnology
Scattering, Radiation
Spectrophotometry
Surface Plasmon Resonance
Water
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https://hdl.handle.net/10161/4226Collections
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Show full item recordScholars@Duke
Adam P. Wax
Professor of Biomedical Engineering
Dr. Wax's research interests include optical spectroscopy for early cancer detection,
novel microscopy and
interferometry techniques.
The study of intact, living cells with optical spectroscopy offers the opportunity
to observe cellular structure, organization and dynamics in a way that is not possible
with traditional methods. We have developed a set of novel spectroscopic techniques
for measuring spatial, temporal and refractive structure on sub-hertz and sub-wavelength
scales based
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