Abstract
We propose output deviations as a surrogate metric to grade functional test sequences
at the register-transfer level without explicit fault simulation. Experimental results
for the open-source Biquad filter core and the Scheduler module of the Illinois Verilog
Model show that the deviations metric is computationally efficient and it correlates
well with gate-level coverage for stuck-at, transition-delay and bridging faults.
Results also show that functional test sequences reordered based on output deviations
provide steeper gate-level fault coverage ramp-up compared to other ordering methods.
© 2011 IEEE.
Published Version (Please cite this version)
10.1109/TVLSI.2011.2163651
Publication Info
Fang, H; Chakrabarty, K; Jas, A; Patil, S; & Tirumurti, C (2012). Functional test-sequence grading at register-transfer level.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems,
20(10). pp. 1890-1894.
10.1109/TVLSI.2011.2163651.
Retrieved from https://hdl.handle.net/10161/4641.
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