Functional test-sequence grading at register-transfer level
Abstract
We propose output deviations as a surrogate metric to grade functional test sequences
at the register-transfer level without explicit fault simulation. Experimental results
for the open-source Biquad filter core and the Scheduler module of the Illinois Verilog
Model show that the deviations metric is computationally efficient and it correlates
well with gate-level coverage for stuck-at, transition-delay and bridging faults.
Results also show that functional test sequences reordered based on output deviations
provide steeper gate-level fault coverage ramp-up compared to other ordering methods.
© 2011 IEEE.
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Journal articlePermalink
https://hdl.handle.net/10161/4641Published Version (Please cite this version)
10.1109/TVLSI.2011.2163651Publication Info
Fang, H; Chakrabarty, K; Jas, A; Patil, S; & Tirumurti, C (2012). Functional test-sequence grading at register-transfer level. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 20(10). pp. 1890-1894. 10.1109/TVLSI.2011.2163651. Retrieved from https://hdl.handle.net/10161/4641.This is constructed from limited available data and may be imprecise. To cite this
article, please review & use the official citation provided by the journal.
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Show full item recordScholars@Duke
Krishnendu Chakrabarty
John Cocke Distinguished Professor of Electrical and Computer Engineering
Krishnendu Chakrabarty is the John Cocke Distinguished Professor of Electrical and
Computer Engineering and Professor of Computer Science at Duke University. He is Chair
of the Department of Electrical and Computer Engineering.Please note this web page
is not updated regularly. For up to date information, please go to: http://people.ee.duke.edu/~krish/.
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