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Market Valuation of Patent Characteristics

dc.contributor.author Wang, Kevin
dc.date.accessioned 2013-04-16T12:07:44Z
dc.date.available 2013-04-16T12:07:44Z
dc.date.issued 2013-04-16
dc.identifier.uri https://hdl.handle.net/10161/6522
dc.description.abstract Measuring the returns to R&D has been an endeavor pursued by economists with vast interest in an effort to learn more about the characteristics of successful R&D. This paper empirically measures the market valuation of firms using patent statistics as a proxy for the success of R&D. It finds that self-citation and generality patent measures are largely insignificant likely due to a tendency for newer patents to be measured incorrectly. It also attempts a measure of companies’ reputation for innovation for valuation and proposes a new method of quantification. Lastly, it finds that the market valuation of R&D investment is potentially myopic during years of stock market downturns.
dc.language.iso en_US
dc.subject Innovation
dc.subject Market Value
dc.subject Tobin's Q
dc.subject Patent Generality
dc.subject Returns to R&D
dc.subject Self-citations
dc.title Market Valuation of Patent Characteristics
dc.type Honors thesis
dc.department Economics


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