Measurement-induced quantum phases realized in a trapped-ion quantum computer

dc.contributor.author

Noel, C

dc.contributor.author

Niroula, P

dc.contributor.author

Zhu, D

dc.contributor.author

Risinger, A

dc.contributor.author

Egan, L

dc.contributor.author

Biswas, D

dc.contributor.author

Cetina, M

dc.contributor.author

Gorshkov, AV

dc.contributor.author

Gullans, MJ

dc.contributor.author

Huse, DA

dc.contributor.author

Monroe, C

dc.date.accessioned

2022-10-05T17:39:25Z

dc.date.available

2022-10-05T17:39:25Z

dc.date.issued

2022-07-01

dc.date.updated

2022-10-05T17:39:24Z

dc.description.abstract

Many-body open quantum systems balance internal dynamics against decoherence and measurements induced by interactions with an environment1,2. Quantum circuits composed of random unitary gates with interspersed projective measurements represent a minimal model to study the balance between unitary dynamics and measurement processes3–5. As the measurement rate is varied, a purification phase transition is predicted to emerge at a critical point akin to a fault-tolerant threshold6. Here we explore this purification transition with random quantum circuits implemented on a trapped-ion quantum computer. We probe the pure phase, where the system is rapidly projected to a pure state conditioned on the measurement outcomes, and the mixed or coding phase, where the initial state becomes partially encoded into a quantum error correcting codespace that keeps the memory of initial conditions for long times6,7. We find experimental evidence of the two phases and show numerically that, with modest system scaling, critical properties of the transition emerge.

dc.identifier.issn

1745-2473

dc.identifier.issn

1745-2481

dc.identifier.uri

https://hdl.handle.net/10161/26065

dc.language

en

dc.publisher

Springer Science and Business Media LLC

dc.relation.ispartof

Nature Physics

dc.relation.isversionof

10.1038/s41567-022-01619-7

dc.title

Measurement-induced quantum phases realized in a trapped-ion quantum computer

dc.type

Journal article

duke.contributor.orcid

Noel, C|0000-0002-2977-2747

duke.contributor.orcid

Cetina, M|0000-0003-1942-9977

pubs.begin-page

760

pubs.end-page

764

pubs.issue

7

pubs.organisational-group

Duke

pubs.organisational-group

Pratt School of Engineering

pubs.organisational-group

Electrical and Computer Engineering

pubs.publication-status

Published

pubs.volume

18

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