Statistics for Test-pattern selection for screening small-delay defects in very-deep submicrometer integrated circuits

Total visits

views
Test-pattern selection for screening small-delay defects in very-deep submicrometer integrated circuits 363

Total visits per month

views
January 2024 0
February 2024 0
March 2024 0
April 2024 0
May 2024 0
June 2024 0
July 2024 0

File Visits

views
Chakrabarty_duke_tech_report_2009.pdf 587

Top country views

views
United States 62
China 38
Germany 31
France 22
Canada 21
United Kingdom 20
India 16
Hong Kong SAR China 14
South Korea 8
Russia 8
Netherlands 7
Taiwan 5
Portugal 4
Brazil 1
Colombia 1
Denmark 1
Spain 1
Hungary 1
Israel 1
Italy 1
Moldova 1
Malaysia 1
Singapore 1

Top city views

views
Beijing 25
Kwai Chung 14
Alexandria 13
Göttingen 10
Omemee 10
Sainte-thérèse 10
Bangalore 8
Durham 8
Seattle 7
Kiez 6
Seoul 6
Mountain View 5
San Jose 5
Tokyo 5
Lisbon 4
Munich 3
Taipei 3
Woodbridge 3
Brunswick 2
Schenectady 2
Shenzhen 2
Storrs Mansfield 2
Syracuse 2
Alexander 1
Ankeny 1
Atlanta 1
Auburn University 1
Bilbao 1
Bogotá 1
Brooklyn 1
Brossard 1
Campinas 1
Carbondale 1
Changi 1
Chapel Hill 1
Cincinnati 1
Guangzhou 1
Haifa 1
Hsinchu 1
Kochi 1
Kota Kinabalu 1
Lake Forest 1
Los Angeles 1
Madras 1
Minneapolis 1
Nanjing 1
Nellore 1
Newtonville 1
Overland Park 1
Paderborn 1
Piscataway 1
Prinsenbeek 1
Saint Petersburg 1
San Diego 1
Santa Clara 1
Suzhou 1
Taoyuan 1
Tiruppur 1
University Park 1
Verona 1
Washington 1
Wilmington 1
Yulee 1