Functional test-sequence grading at register-transfer level

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2012-01-01

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Abstract

We propose output deviations as a surrogate metric to grade functional test sequences at the register-transfer level without explicit fault simulation. Experimental results for the open-source Biquad filter core and the Scheduler module of the Illinois Verilog Model show that the deviations metric is computationally efficient and it correlates well with gate-level coverage for stuck-at, transition-delay and bridging faults. Results also show that functional test sequences reordered based on output deviations provide steeper gate-level fault coverage ramp-up compared to other ordering methods. © 2011 IEEE.

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10.1109/TVLSI.2011.2163651

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Fang, H, K Chakrabarty, A Jas, S Patil and C Tirumurti (2012). Functional test-sequence grading at register-transfer level. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 20(10). pp. 1890–1894. 10.1109/TVLSI.2011.2163651 Retrieved from https://hdl.handle.net/10161/4641.

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