Terahertz Digital Holographic Imaging of Voids Within Visibly Opaque Dielectrics
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2014-11-11
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Abstract
Terahertz digital off-axis holography (THzDH) has been demonstrated as a non-destructive tool for imaging voids within visually opaque dielectrics. Using a raster scanning heterodyne detector, the imager captures lensless transmission holograms formed by the interaction of a highly coherent, monochromatic beam with 3-D printed structures. Digital hologram reconstructions from two structures were used to measure the imager's modulation transfer function and to show that terahertz digital holography can provide sub-millimeter resolution images of voids within visually opaque printed structures. As a demonstration we imaged embedded air- and lossy dielectric filled-voids whose refractive indices differ from the host material.
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Heimbeck, MS, WR Ng, DR Golish, ME Gehm and HO Everitt (2014). Terahertz Digital Holographic Imaging of Voids Within Visibly Opaque Dielectrics. IEEE Transactions on Terahertz Science and Technology. 10.1109/TTHZ.2014.2364511 Retrieved from https://hdl.handle.net/10161/13870.
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Scholars@Duke
Michael E. Gehm
Michael Gehm received a B.S. in Mechanical Engineering from Washington University in St. Louis in 1992. He earned his A.M. and Ph.D. degrees in Physics from Duke University in 1998 and 2003, respectively. From 2003–2005, he was a Research Associate in ECE at Duke, followed by a year as an Assistant Research Professor. In 2007 he moved to the University of Arizona as an Assistant Professor of ECE and was jointly appointed an Assistant Professor of Optical Sciences in 2009. He was promoted to Associate Professor of ECE and Optical Sciences in 2013 before returning to Duke as an Associate Professor of ECE later that year. He added a secondary appointment in Physics in 2021. In 2022, he was promoted to Professor of ECE and Physics.
His current research interests are primarily computational and compressive sensing and measurement in all modalities (with special emphasis in Electromagnetic/Optical from RF to x-ray and all forms of Mass spectrometry), with side interests in optical physics, high-performance x-ray simulation, and rapid-prototyping as a means of creating advanced electromagnetic structures.
He is a Fellow of both Optica (formerly, OSA) and SPIE.
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