Terahertz Digital Holographic Imaging of Voids Within Visibly Opaque Dielectrics
dc.contributor.author | Heimbeck, MS | |
dc.contributor.author | Ng, WR | |
dc.contributor.author | Golish, DR | |
dc.contributor.author | Gehm, ME | |
dc.contributor.author | Everitt, HO | |
dc.date.accessioned | 2017-03-19T00:53:29Z | |
dc.date.available | 2017-03-19T00:53:29Z | |
dc.date.issued | 2014-11-11 | |
dc.description.abstract | Terahertz digital off-axis holography (THzDH) has been demonstrated as a non-destructive tool for imaging voids within visually opaque dielectrics. Using a raster scanning heterodyne detector, the imager captures lensless transmission holograms formed by the interaction of a highly coherent, monochromatic beam with 3-D printed structures. Digital hologram reconstructions from two structures were used to measure the imager's modulation transfer function and to show that terahertz digital holography can provide sub-millimeter resolution images of voids within visually opaque printed structures. As a demonstration we imaged embedded air- and lossy dielectric filled-voids whose refractive indices differ from the host material. | |
dc.identifier.issn | 2156-342X | |
dc.identifier.uri | ||
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | |
dc.relation.ispartof | IEEE Transactions on Terahertz Science and Technology | |
dc.relation.isversionof | 10.1109/TTHZ.2014.2364511 | |
dc.title | Terahertz Digital Holographic Imaging of Voids Within Visibly Opaque Dielectrics | |
dc.type | Journal article | |
duke.contributor.orcid | Gehm, ME|0000-0003-4163-749X | |
duke.contributor.orcid | Everitt, HO|0000-0002-8141-3768 | |
pubs.organisational-group | Duke | |
pubs.organisational-group | Electrical and Computer Engineering | |
pubs.organisational-group | Physics | |
pubs.organisational-group | Pratt School of Engineering | |
pubs.organisational-group | Trinity College of Arts & Sciences | |
pubs.publication-status | Accepted |
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